Design of elliptical crystal spectrograph analyzer

Jun Shi,Shali Xiao,Xiaoming Lei,Dongqiang Xu,Shixin Zhang
DOI: https://doi.org/10.19650/j.cnki.cjsi.2008.05.017
2008-01-01
Abstract:Inertial confinement fusion (ICF) radiates a lot of X-rays, which contain significant information, such as electron temperature, density, ionization and etc. X-ray spectrograph is used as a means of diagnosing the status of laser-produced plasmas for controlling ICF. The paper studies the theories of elliptical crystal analyzer of spectrograph, analyses the integrated reflectivity and absorption coefficient. The key component of the X-ray crystal spectrometer is an elliptical curved crystal analyzer. The spectrograph has a focal length of 1350 mm and for these measurements, LiF crystal bent onto an elliptical substrate with eccentricity e=0.9586 is utilized. The crystal analyzer covers the Bragg angel range from 30° to 60°. The analyzer is based on elliptically geometrical principle, which has self-focusing characteristics. In the experiment, the curved crystal spectrograph-recorded X-ray spectrum is at 90° to the laser axis and 45° to the target normal direction. The experiment suggests that the sensitivity of the focusing crystal analyzer is greatly improved over a flat crystal. The calculated wavelength resolution is above 900 in the range of 0.2-0.35 nm. So the curved analyzer is suitable for diagnosing soft X-ray spectroscopy.
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