The Dissociation of Excitons at Indium Tin Oxide-Copper Phthalocyanine Interface in Organic Solar Cells

X. Y. Sun,Q. L. Song,M. L. Wang,X. M. Ding,X. Y. Hou,Z. G. Zhou,F. Y. Li
DOI: https://doi.org/10.1063/1.3020525
IF: 2.877
2008-01-01
Journal of Applied Physics
Abstract:Exciton dissociation process at indium tin oxide (ITO)/copper phthalocyanine (CuPc) interface of ITO/CuPc(370 nm)/Al is studied by transient photovoltage method. A negative-to-positive change in the polarity of photovoltage upon pulsed laser irradiation is observed in CuPc thin film. The polarity change is regarded as a summation of the effect of exciton dissociation at ITO/CuPc interface (fast process) and that of free carrier separation by built-in field (slow process). Further experiments confirm the existence of exciton dissociation at ITO/CuPc interface, and the direction of which is electron injected into ITO, with holes left in CuPc film. This is opposite to that of the interfacial dissociation at donor/acceptor (D/A) interface in single heterojunction cells (ITO/D/A/buffer/Al). 3-nm-thick LiF insulating layer is inserted between ITO and CuPc to inhibit the exciton dissociation at ITO/CuPc interface. Thereby, the open-circuit voltage and power conversion efficiency of the single layer cell have been increased by several times.
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