Resistive Switching Behavior of Pt/Mg0.2zn0.8o/Pt Devices for Nonvolatile Memory Applications

Xinman Chen,Guangheng Wu,Dinghua Bao
DOI: https://doi.org/10.1063/1.2978158
IF: 4
2008-01-01
Applied Physics Letters
Abstract:Highly c-axis oriented Mg0.2Zn0.8O thin films with hexagonal structure were prepared on Pt/TiO2/SiO2/Si substrates by sol-gel spin coating technique. The Pt/Mg0.2Zn0.8O/Pt devices showed a reversible and steady resistance switching characteristic. The resistance switching from low resistance state (LRS) to high resistance state (HRS) with a resistance ratio of HRS to LRS of about 25 was achieved at a voltage of as low as 0.65 V. The dominant conduction mechanisms of LRS and HRS were explained by Ohmic behavior and trap-controlled space charge limited current, respectively. Furthermore, formation of conducting filaments in LRS was suggested. This study indicates that the Pt/Mg0.2Zn0.8O/Pt device may be a promising candidate for memristor applications.
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