Temporally And Spatially High-Resolved Spectroscopy And Its Applications

Qihuang Gong,Zhi Li,Jiasen Zhang,Hong Yang

DOI: https://doi.org/10.1109/CLEOPR.2007.4391230

2007-01-01

What problem does this paper attempt to address?

Ultrahigh Spatiotemporal Resolved Spectroscopy

Li Zhi,Zhang JiaSen,Yang Jing,Gong QiHuang

DOI: https://doi.org/10.1007/s11433-007-0077-z

2007-01-01

Abstract:We review the technique and research of the ultrahigh spatiotemporal resolved spectroscopy and its applications in the field of the ultrafast dynamics of mesoscopic systems and nanomaterials. Combining femtosecond time-resolved spectroscopy and scanning near-field optical microscopy (SNOM), we can obtain the spectra with ultrahigh temporal and spatial resolutions simultaneously. Some problems in doing so are discussed. Then we show the important applications of the ultrahigh spatiotemporal resolved spectroscopy with a few typical examples.
Realization of Femtosecond-Resolved Near-Field Optical System and Its Application

Li Zhi,Zhang Jia-Sen,Yang Jing,Gong Qi-Huang

DOI: https://doi.org/10.7498/aps.56.3630

IF: 0.906

2007-01-01

Acta Physica Sinica

Abstract:By combining femtosecond laser with the scanning near-field optical microscope (SNOM), we have successfully realized the femtosecond-resolved near-field optical system. Through high frequency acousto-optic modulation and difference frequency lock-in detection, the signal-to-noise ratio was greatly improved and the background signals of the pump and probe light were removed. Therefore, we can measure a femtosecond-resolved weak transmission change in the collection mode SNOM. Spatial resolution of 80 nm and temporal resolution better than 200 fs were achieved simultaneously. Using this system, we studied the relaxation processes of hot electrons in gold nanostrucures and the difference in relaxation dynamics was observed at different sample positions.
Nanoimaging and Nanospectroscopy of Polaritons with Time Resolved S‐snom

Ziheng Yao,Suheng Xu,Debo Hu,Xinzhong Chen,Qing Dai,Mengkun Liu

DOI: https://doi.org/10.1002/adom.201901042

IF: 9

2019-01-01

Advanced Optical Materials

Abstract:The development of electronics and photonics is entering a new era of ultrahigh speed sensing, data processing, and telecommunication. The carrier frequencies of the next‐generation electronic devices inevitably extend beyond radio frequencies, marching toward the nominally photonics‐dominated territories, e.g., terahertz and beyond. As a result, electronic and photonic techniques naturally merge and seek common ground. At the forefront of this technical trend is the field of polaritonics, where polaritons are half‐light, half‐matter quasiparticles that carry the properties of both “bare” photons and “bare” dipole‐carrying excitations. The Janus‐faced nature of polaritons renders the unique capability of operando control using photoexcitation or applied electric field. Here, state‐of‐the‐art ultrafast polaritonic phenomena probed by scattering‐type scanning near‐field optical microscope (s‐SNOM) techniques is reviewed. The ultrafast dynamical control and loss‐reduction of the polariton propagation are discussed with special emphasis on the creation and probing of the tip or edge induced plasmon– and phonon–polaritons in low‐dimensional systems. The detailed technical aspects of s‐SNOM and its possible future development are also presented.
Terahertz Nano-Imaging with s-SNOM

Matthias M. Wiecha,Amin Soltani,Hartmut G. Roskos

DOI: https://doi.org/10.5772/intechopen.99102

2021-10-30

Abstract:Spectroscopy and imaging with terahertz radiation propagating in free space suffer from the poor spatial resolution which is a consequence of the comparatively large wavelength of the radiation (300 μm at 1 THz in vacuum) in combination with the Abbe diffraction limit of focusing. A way to overcome this limitation is the application of near-field techniques. In this chapter, we focus on one of them, scattering-type Scanning Near-field Optical Microscopy (s-SNOM) which − due to its versatility − has come to prominence in recent years. This technique enables a spatial resolution on the sub-100-nm length scale independent of the wavelength. We provide an overview of the state-of-the-art of this imaging and spectroscopy modality, and describe a few selected application examples in more detail.
Setup and Application of Scanning Near-Field Optical Microscopy

SF Xu,X Zhu,HT Zhou,YM Shen,T Fei,Y Zhang,Y Yin,B Zhang,L Dai,XL Liu,JC Hu,P Lu,ZH Zhai

DOI: https://doi.org/10.1088/1009-1963/10/13/035

2001-01-01

Chinese Physics

Abstract:The research on the setup and application of scanning near-field optical microscopy (SNOM) performed in our laboratory is reviewed in this report. We have constructed a versatile low temperature scanning near-field optical microscope with the capability of near-field imaging and spectroscopy, operating at liquid nitrogen temperature. A special designed coaxial double lens was used to introduce the illumination beam through a 200 mum fiber; the detected optical signal was transmitted via a fiber tip to an avalanche photon detector. The performance test shows the stability of the new design. The shear force image and optical image of a standard sample are shown. A system of SNOM working at room temperature and atmosphere was used to characterize semiconductors and bio-molecular samples. It revealed the unique features of semiconductor microdisks in the near-field that is significantly different from that of far-field. The effects of different geographic microstructures on the near-field light distribution of InGaP, GaN, and InGaN multi-quantum-well microdisk were observed.
Polariton Spectroscopy: Nanoimaging and Nanospectroscopy of Polaritons with Time Resolved S ‐SNOM (advanced Optical Materials 5/2020)

Ziheng Yao,Suheng Xu,Debo Hu,Xinzhong Chen,Qing Dai,Mengkun Liu

DOI: https://doi.org/10.1002/adom.202070019

IF: 9

2020-01-01

Advanced Optical Materials

Abstract:Time-resolved nanoimaging of polaritons using scanning near-field optical microscopes is highlighted in a progress report by Ziheng Yao, Qing Dai, Mengkun Liu and co-workers (article number 1901042). The measurement of ultrafast dynamics of polariton propagation with nanoscale resolution is only recently achievable with the advances in laser and near-field techniques. The creation and probing of the tip- and edge-induced plasmon-polaritons and phonon-polaritons in low-dimensional systems are discussed in detail.
Ultra-Fast Resonance Response of Cantilevered Probe in TDS s-SNOM

Yueying Wang,Zhuocheng Zhang,Tianyu Zhang,Min Hu,Shenggang Liu

DOI: https://doi.org/10.1109/icops37625.2020.9717566

2020-01-01

Abstract:TDS s-SNOM, combining Terahertz Time Domain Spectro scopy(TDS) and scattering type Scanning Near-field Optical Microscope (s-SNOM), can achieve both nano-scale spatial resolution and ps-scale temporal resolution, which has great potential for scientific application.
Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Xinzhong Chen,Debo Hu,Ryan Mescall,Guanjun You,D. N. Basov,Qing Dai,Mengkun Liu

DOI: https://doi.org/10.1002/adma.201804774

IF: 29.4

2019-04-01

Advanced Materials

Abstract:Infrared and optical spectroscopy represents one of the most informative methods in advanced materials research. As an important branch of modern optical techniques that has blossomed in the past decade, scattering-type scanning near-field optical microscopy (s-SNOM) promises deterministic characterization of optical properties over a broad spectral range at the nanoscale. It allows ultrabroadband optical (0.5-3000 µm) nanoimaging, and nanospectroscopy with fine spatial (<10 nm), spectral (<1 cm<sup>-1</sup> ), and temporal (<10 fs) resolution. The history of s-SNOM is briefly introduced and recent advances which broaden the horizons of this technique in novel material research are summarized. In particular, this includes the pioneering efforts to study the nanoscale electrodynamic properties of plasmonic metamaterials, strongly correlated quantum materials, and polaritonic systems at room or cryogenic temperatures. Technical details, theoretical modeling, and new experimental methods are also discussed extensively, aiming to identify clear technology trends and unsolved challenges in this exciting field of research.

materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology
Scanning Near-field Optical Microscope and Application

Xiumei Liu,Jia Wang,Dacheng Li

DOI: https://doi.org/10.3321/j.issn:0258-7025.1999.09.007

1999-01-01

Abstract:The scanning near-field optical microscope (SNOM) breaks the diffraction limit of the conventional optical microscope. It has promising applications in the fields of material science, biological engineering, and semiconductor physics. A versatile SNOM, which can operate in illumination mode, collection mode and frustration total internal reflection (TIR) mode, was developed. Several kinds of samples including holographic grating, liposome and powder of BaCO2 were investigated. Images with an optical resolution of 100 nm were obtained.
Development of in Situ Optical Spectroscopy with High Temporal Resolution in an Aberration-Corrected Transmission Electron Microscope.

Chang Liu,Chaojie Ma,Jinjing Xu,Ruixi Qiao,Huacong Sun,Xiaomin Li,Zhi Xu,Peng Gao,Enge Wang,Kaihui Liu,Xuedong Bai

DOI: https://doi.org/10.1063/5.0031115

IF: 1.6

2021-01-01

Review of Scientific Instruments

Abstract:Exploring the corresponding relation between structural and physical properties of materials at the atomic scale remains the fundamental problem in science. With the development of the aberration-corrected transmission electron microscopy (AC-TEM) and the ultrafast optical spectroscopy technique, sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution can be achieved, respectively. However, the attempt to combine both their advantages is still a great challenge. Here, we develop in situ optical spectroscopy with high temporal resolution in AC-TEM by utilizing a self-designed and manufactured TEM specimen holder, which has the capacity of sub-angstrom-scale spatial resolution and femtosecond-scale temporal resolution. The key and unique design of our apparatus is the use of the fiber bundle, which enables the delivery of focused pulse beams into TEM and collection of optical response simultaneously. The generated focused spot has a size less than 2 µm and can be scanned in plane with an area larger than 75 × 75 µm2. Most importantly, the positive group-velocity dispersion caused by glass fiber is compensated by a pair of diffraction gratings, thus resulting in the generation of pulse beams with a pulse width of about 300 fs (@ 3 mW) in TEM. The in situ experiment, observing the atomic structure of CdSe/ZnS quantum dots in AC-TEM and obtaining the photoluminescence lifetime (∼4.3 ns) in the meantime, has been realized. Further ultrafast optical spectroscopy with femtosecond-scale temporal resolution could be performed in TEM by utilizing this apparatus.
Near-field Optical Characterization of Low-Dimensional Nanomaterials

Debo Hu,Qing Dai

DOI: https://doi.org/10.1360/n972018-00864

2018-01-01

Chinese Science Bulletin (Chinese Version)

Abstract:Due to the wave nature of light, the spatial resolution of traditional far-field optical microscopy is fundamentally prohibited to be much smaller than the wavelength, thus cannot fulfill the requirement of nano-characterization of low-dimensional materials. This diffraction limit can be circumvented by the optical version of scanning probe microscopy via incorporating the near-field optical information into the imaging process. In the last one and a half decades, scanning near-field optical microscopic techniques, especially scattering-type scanning near-field optical microscopy (s-SNOM), have undergone tremendous development. The wavelength independent spatial resolution of s-SNOM goes far beyond the diffraction limit, leading to an explosive amount of applications that spread throughout the field of materials science. The instrument of s-SNOM is a delicate combination of optical and scanning probe techniques. It utilizes the sharp tip of an atomic force microscope (AFM) probe to achieve nanoscale spatial resolution. Specifically, the light beam from a source is focused onto the apex of the AFM tip by a parabolic mirror. The tip serves as a nanoscale light confiner and enhancer, inducing a strong electromagnetic field (hot spot) underneath the tip apex. When the tip is brought into contact with the investigated sample, this field is modified by its interaction with the sample and carries near-field information of the sample. Then the tip acting as an optical antenna scatters the near-field information into far-field. The back-scattered near-field signals are feed into a photodetector to register a near-field image of the sample. By modulating the near-field signal via tapping the AFM tip and demodulating at the high order harmonics of the tip-tapping frequency, the noise from the background and stray light can be greatly suppressed. Since the near-field hot spot is on the same scale with the tip apex, the spatial resolution of s-SNOM is predominantly defined by the dimensions of the tip; a value of 20 nm is routinely achievable with commercially available and economical AFM tips. In principle, s-SNOM is a permittivity-sensitive technique, thus its most typical application is to imaging the surface permittivity distributions of low-dimensional nanomaterials. In the literatures, s-SNOM has been used to realize material-specific identification of zero-dimensional nanoparticles; nanoscale-resolved mapping of the free-carrier distribution along a one-dimensional nanowire and two-dimensional nanoimaging of the phase boundaries of organic thin films have been reported. Surprisingly, sub-surface imaging of objects with a depth of tens of nanometers has also been proved possible. By using the pump-probe method, the ultrafast dynamical properties of low-dimensional materials can be characterized with simultaneously high spatial and temporal resolutions. The s-SNOM tip can also serve as a momentum matcher between the free-space light and the intrinsic electromagnetic modes supported by low-dimensional materials, therefore, s-SNOM can be used to excite and image these modes. Both field mapping of localized modes in zero-dimensional materials and fringe pattern imaging of propagating modes in one- and two-dimensional materials have been reported. What is more, direct imaging of the wave packets has also been achieved by coupling s-SNOM to ultrafast optics. s-SNOM can provide spectral information of the sample if a broadband light source is used. A Fourier transform infrared (FTIR) spectrometer based on s-SNOM (nano-FTIR) has been developed. The spectra obtained by nano-FTIR have been demonstrated to be in good agreement with those acquired by conventional FTIR. Applications of the nano-FTIR including in-situ monitoring of chemical reactions and quick mapping of the dispersion of polaritons have been reported. In summary, s-SNOM has contributed significantly to the field of low-dimensional material characterizing. Nonetheless, it still has a large potential to expand its scope of applications. This is especially true at extreme conditions like ultrahigh vacuum, ultralow temperature, and strong magnetic field. If s-SNOM operating in these extreme conditions can be developed, it would be of great help in solving the enigma of strongly correlated materials.
Ultrafast Hot Electron Relaxation In A Metal Nanostructure Detected By Femtosecond-Snom

Zhi Li,Song Yue,Jianjun Chen,Qihuang Gong

DOI: https://doi.org/10.1364/qels.2010.jthe11

2010-01-01

Abstract:Ultrahigh spatiotemporal resolved pump-probe signal on a metal nanostructure is detected by femtosecond-SNOM. By using two-color pump-probe configuration, ultrafast hot electron transportation is clearly observed on a time scale of a few hundred femtoseconds. (C) 2010 Optical Society of America
High-speed Spectral-Domain Optical Coherence Tomography at 830nm Wavelength

Kai Wang,Gang Huang,Zhihua Ding,Ling Wang

DOI: https://doi.org/10.1117/12.757208

2007-01-01

Abstract:We present a high-speed spectral domain optical coherence tomography (SD-OCT) system at 830 nm wavelength which is consisted of a fiber based Michelson interferometer and a custom-built spectrometer. The designed resolution of the spectrometer is about 67.4pm which limits the maximum detection depth 2.56mm in air. And the 35us exposure time of the high speed line scan CCD makes real-time imaging possible. Furthermore, a novel method of spectrometer calibration is put forward. The method can remove the influence of dispersion mismatch, thus accurately determine the distribution of wavelength on the line scan CCD, which leads to a precise interpolation and a subsequent better contrast image.
Application of Femtosecond Laser Pulse to Nano-Photonics Materials and Devices

Qihuang Gong

DOI: https://doi.org/10.1109/INOW.2007.4302857

2007-01-01

Abstract:Recently, ultrafast laser pulse has provided new measures for the investigation on nonlinear optical materials and devices. In this report, I will firstly review time-resolved experimental setups, including fs time-resolved SNOM system and pump-probe system, in our laboratory. Then I will demonstrate an ultrafast all-optical tunable filter or switch based on two-dimensional nonlinear polymeric photonic crystal made of pure or dye-doped polystyrene. The study on the relaxation dynamics of hot electrons in gold nanostructures and different relaxation was also reported by using the fs-SNOM system. Moreover, the nano/micro-photonic structures fabricated based on multi-photon absorption in both transparent dielectric media and organic polymer in our laboratory will be reviewed.
Instrumentation for dual-probe scanning near-field optical microscopy

A Kaneta,R Fujimoto,T Hashimoto,K Nishimura,M Funato,Y Kawakami

DOI: https://doi.org/10.1063/1.4737883

Abstract:To investigate local carrier motions, we developed a dual-probe scanning near-field optical microscope (SNOM) with two fiber probes where one is for photoexcitation and the other is for light collection. This instrumentation is based on two important techniques: the design of probe structures and distance control between the sample surface and the two probes. A finite-difference time-domain method numerically analyzed and optimized the design for high efficiency photoexcitation and light collection, while a dual band modulation realized distance control. Real time detection of the oscillations of the probe tips using different frequencies independently controls the distance between the probe tip and the sample surface as well as the distance between the two probes. Thus, the collection probe can be scanned around an illumination probe without destroying the probe tips. To demonstrate our SNOM, we performed photoluminescence spectroscopy under the dual-probe configuration and observed carrier motions in an InGaN quantum well.
Broadband ultraviolet-visible transient absorption spectroscopy in the nanosecond to microsecond time domain with sub-nanosecond time resolution.

D. Lovy,V. Markovic,S. Mosquera-Vázquez,P. Sherin,Bernhard Lang,E. Vauthey

DOI: https://doi.org/10.1063/1.4812705

IF: 1.6

2013-07-11

Review of Scientific Instruments

Abstract:A combination of sub-nanosecond photoexcitation and femtosecond supercontinuum probing is used to extend femtosecond transient absorption spectroscopy into the nanosecond to microsecond time domain. Employing a passively Q-switched frequency tripled Nd:YAG laser and determining the jitter of the time delay between excitation and probe pulses with a high resolution time delay counter on a single-shot basis leads to a time resolution of 350 ps in picosecond excitation mode. The time overlap of almost an order of magnitude between fs and sub-ns excitation mode permits to extend ultrafast transient absorption (TA) experiments seamlessly into time ranges traditionally covered by laser flash photolysis. The broadband detection scheme eases the identification of intermediate reaction products which may remain undetected in single-wavelength detection flash photolysis arrangements. Single-shot referencing of the supercontinuum probe with two identical spectrometer/CCD arrangements yields an excellent signal-to-noise ratio for the so far investigated chromophores in short to moderate accumulation times.

Physics,Medicine,Materials Science
Pushing the limits of deep-ultraviolet scanning near-field optical microscopy

Ryota Ishii,Mitsuru Funato,Yoichi Kawakami

DOI: https://doi.org/10.1063/1.5097865

IF: 5.6

2019-07-01

APL Photonics

Abstract:Deep-ultraviolet (DUV) microscopy and microspectroscopy have received much attention in label-free live-cell imaging, selective molecular analysis, and optical characterizations of ultrawide bandgap materials. Far-field optics approaches usually suffer from the diffraction limit of light. Meanwhile, near-field optics technology is immature in the DUV spectral region. Herein, we develop a DUV scanning near-field optical microscope (SNOM) with an excitation wavelength of 210 nm. The fourth harmonic generation of a continuous-wave Ti:sapphire laser is the excitation source. Two negative feedback control systems stabilize the power and pointing, allowing scanning microscopy to be carried out over a long period of time even in the DUV spectral region. A reflective objective couples the excitation beam onto an optical fiber probe. The optical fiber probe is solarization-resistant and is not coated by metallic materials. The reflective-based objective optical design does not introduce chromatic aberrations in the detection signals. Our DUV-SNOM is used to measure the photoluminescence (PL) spectra of the quantum well structure of aluminum gallium nitride, which is an ultrawide bandgap material. The PL mapping images indicate that emissive localization centers can be individually visualized via our DUV-SNOM with a lateral resolution exceeding 150 nm.

optics,physics, applied
Temporal Imaging for Ultrafast Spectral-Temporal Optical Signal Processing and Characterization

Bowen Li,Sheng Wang,Yuan Wei,Shu-Wei Huang,Kenneth K. Y. Wong

DOI: https://doi.org/10.1109/jstqe.2020.3012882

IF: 4.9

2021-03-01

IEEE Journal of Selected Topics in Quantum Electronics

Abstract:Temporal imaging is one of the most promising all-optical signal processing techniques that enable single-shot ultrafast signal characterization in both spectral and temporal domains. However, conventional temporal imaging systems have inherent constraints such as limited record length, narrow spectral observation range and complex system configuration, which prevent their potential to be fully unleashed. In this article, we review the recent efforts in developing advanced temporal imaging systems with much enhanced performance. Their powerful applications are demonstrated by real-time single-shot characterization of Kerr soliton generation in microresonator, noise-like pulses in mode-locked fiber lasers, broadband frequency combs and the dynamic waveform in ultrafast optical tomography. In addition, potential future developments of this technique in several important directions are discussed.

engineering, electrical & electronic,optics,physics, applied,quantum science & technology
Multi-Domain High-Resolution Platform For Integrated Spectroscopy And Microscopy Characterizations

Li Wang,Shenlong Jiang,Qun Zhang,Yi Luo

DOI: https://doi.org/10.1063/1674-0068/cjcp2006093

IF: 1.09

2020-01-01

Chinese Journal of Chemical Physics

Abstract:In recent decades, materials science has experienced rapid development and posed increasingly high requirements for the characterizations of structures, properties, and performances. Herein, we report on our recent establishment of a multi-domain (energy, space, time) high-resolution platform for integrated spectroscopy and microscopy characterizations, offering an unprecedented way to analyze materials in terms of spectral (energy) and spatial mapping as well as temporal evolution. We present several proof-of-principle results collected on this platform, including in-situ Raman imaging (high-resolution Raman, polarization Raman, low-wavenumber Raman), time-resolved photoluminescence imaging, and photo-electrical performance imaging. It can be envisioned that our newly established platform would be very powerful and effective in the multi-domain high-resolution characterizations of various materials of photoelectrochemical importance in the near future.
Characterization for Optical Properties of Photonic Materials and Devices by SNOM

王佳,徐铁军

DOI: https://doi.org/10.3321/j.issn:1002-1582.2002.05.004

2002-01-01

Optical Technique

Abstract:Due to the invention of scanning near-field optical microscopy(SNOM),resolution at 50-100nm level using visible or near infrared light is now practical. The SNOM technique as well as its application to the characterization of photonic materials and devices are reviewed. Several examples such as semiconductors, waveguide device and photonic crystal are discussed. Detection of nanometer location of optical field and evanescent field can show many results which can not be found in far field, provides an effective technique for characterization of photoelectrical materials in nanometer scale.

Temporally And Spatially High-Resolved Spectroscopy And Its Applications

Ultrahigh Spatiotemporal Resolved Spectroscopy

Realization of Femtosecond-Resolved Near-Field Optical System and Its Application

Nanoimaging and Nanospectroscopy of Polaritons with Time Resolved S‐snom

Terahertz Nano-Imaging with s-SNOM

Setup and Application of Scanning Near-Field Optical Microscopy

Polariton Spectroscopy: Nanoimaging and Nanospectroscopy of Polaritons with Time Resolved S ‐SNOM (advanced Optical Materials 5/2020)

Ultra-Fast Resonance Response of Cantilevered Probe in TDS s-SNOM

Modern Scattering‐Type Scanning Near‐Field Optical Microscopy for Advanced Material Research

Scanning Near-field Optical Microscope and Application

Development of in Situ Optical Spectroscopy with High Temporal Resolution in an Aberration-Corrected Transmission Electron Microscope.

Near-field Optical Characterization of Low-Dimensional Nanomaterials

Ultrafast Hot Electron Relaxation In A Metal Nanostructure Detected By Femtosecond-Snom

High-speed Spectral-Domain Optical Coherence Tomography at 830nm Wavelength

Application of Femtosecond Laser Pulse to Nano-Photonics Materials and Devices

Instrumentation for dual-probe scanning near-field optical microscopy

Broadband ultraviolet-visible transient absorption spectroscopy in the nanosecond to microsecond time domain with sub-nanosecond time resolution.

Pushing the limits of deep-ultraviolet scanning near-field optical microscopy

Temporal Imaging for Ultrafast Spectral-Temporal Optical Signal Processing and Characterization

Multi-Domain High-Resolution Platform For Integrated Spectroscopy And Microscopy Characterizations

Characterization for Optical Properties of Photonic Materials and Devices by SNOM