Effect of Interfacial Free Energy on Hydriding Reaction of Mg–Ni Thin Films

L. Z. Ouyang,S. Y. Ye,H. W. Dong,M. Zhu
DOI: https://doi.org/10.1063/1.2428877
IF: 4
2007-01-01
Applied Physics Letters
Abstract:The Mg2.9Ni film with preferential orientated nanocrystalline structure was obtained by magnetron sputtering. The hydrogen storage properties and microstructure were investigated by pressure-composition-isotherms measurement, x-ray diffraction and transmission electron microscopy. A reversible hydrogen storage content of about 4.45 mass % at 497 K has been obtained. The preferential orientation of the deposited film was destroyed after only one hydrogenation/dehydrogenation cycle. Both experiment and simplified calculation results proved that the hydrogenation/dehydrogenation reaction temperature decreases due to the extra interfacial free energy stored in the boundary, which demonstrate that Mg based hydride can be substantially destabilized by inducing nanocrystalline structure.
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