Study on "Jump-to-contact" of Atomic Force Microscopy

Fan Kangqi,Jia Jianyuan,Wang Weidong
DOI: https://doi.org/10.3321/j.issn:1004-132X.2007.03.022
2007-01-01
Abstract:Based on the classical elastic theory and Lennard-Jones potential, an elastic model of nano-contact between a sphere and a plane was established to investigate the cause of jump-to-contact of atomic force microscopy (AFM). The variations are obtained of the adhesive force, the contour and the deformation of the sample surface with the AFM tip-sample gap. The results indicate that the sudden jump of the sample surface to the AFM tip is the crucial cause of the jump-to-contact of AFM.
What problem does this paper attempt to address?