Study on CT Value of Damaged Apple

Shumin Xu,yong Yu,Jun Wang
DOI: https://doi.org/10.3969/j.issn.1000-1298.2006.06.021
2006-01-01
Abstract:Picked Fushi apples were used as the experiment objects. The layer of X-ray and computer scan was applied to detect the CT value of apple drop from different heights. On the same scan layer,the CT value of destructive apple decreased with increased of storage time, and the more destruction was made, the lower the CT value was. With the increasing the thickness of scan layer, the CT value of non-destructive apple decreased, while the CT value of destructive apple increased. By changing the storage time, the relation between CT value and destruction is also different.
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