Influence of Damages on Electrical Parameter Values of Apples

Wenchuan Guo,Xinhua Zhu,Kangquan Guo
DOI: https://doi.org/10.3969/j.issn.1000-1298.2006.08.033
2006-01-01
Abstract:Apples were used to find influence of bump and static press damages on electrical parameters in order to find a new method in identifying damaged fruits according to the electrical properties. Test results showed that relative dielectric constant ε′KG-3 _r, and resistivity ρ, of Fuji apples with bump damage or static press damage changed sharply within 0.5 h after damaged,restored rapidly after 0.5 h and became stable during 3~12 h, and ρ of apples without damages kept constant in this period. During storage period,ε′KG-3 _r of apples with bump damage changed abruptly in continuous increasing and that of apples with press damage increased rapidly in earlier storage period and kept constant in later period. Contrasted with damaged apples,ε′KG-3 _r of undamaged apples increased continuously.
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