Influence of Grain Boundaries on the Glass-Transition Behavior in C60 Films

JA Wu,M Gu,P Bao,DA Feng,TB Tang,SZ Yang
DOI: https://doi.org/10.1063/1.2179123
IF: 4
2006-01-01
Applied Physics Letters
Abstract:Two batches of C60 films were prepared via sublimation on Ag (111) at two different growth rates. X-ray diffraction revealed in them a preferential (111) orientation and substantial stacking faults. Their dielectric spectra at various temperatures between 80 and 300K showed broad and asymmetric loss peaks attributable to some orientational glass transition. The nominal activation energies evaluated for the two batches are 344 and 305meV, respectively, larger than the value of 280meV for bulk C60. Applying Ngai’s correlated-state model, we determine the real activation energy, which then agrees well with the bulk value. We propose that, under the ac field, molecular volume changes accompany orientational “jumps” and cause local alternating stresses at grain boundaries, which correlate with the dipole reorientations. This correlation explains the deviation from Debye relaxation behavior and the increase in apparent activation energy.
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