Slot Length Characterizing by Magnetic Flux Leakage Evaluation

Songling Huang,Wei Zhao,Wei Cui
DOI: https://doi.org/10.1179/mte.2006.21.4.233
2006-01-01
Materials Technology
Abstract:"Slot Length Characterizing By Magnetic Flux Leakage Evaluation." Materials Technology, 21(4), pp. 233–234
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