Abstract:The atomic force microscope (AFM) is widely used in a wide range of applications due to its high scanning resolution and diverse scanning modes. In many applications, there is a need for accurate and precise measurement of the vibrational resonance frequency of a cantilever. These frequency shifts can be related to changes in mass of the cantilever arising from, e.g., loss of fluid due to a nanolithography operation. A common method of measuring resonance frequency examines the power spectral density of the free random motion of the cantilever, commonly known as a thermal. While the thermal is capable of reasonable measurement resolution and speed, some applications are sensitive to changes in the resonance frequency of the cantilever, which are small, rapid, or both, and the performance of the thermal does not offer sufficient resolution in frequency or in time. In this work, we describe a method based on a narrow-range frequency sweep to measure the resonance frequency of a vibrational mode of an AFM cantilever and demonstrate it by monitoring the evaporation of glycerol from a cantilever. It can be seamlessly integrated into many commercial AFMs without additional hardware modifications and adapts to cantilevers with a wide range of resonance frequencies. Furthermore, this method can rapidly detect small changes in resonance frequency (with our experiments showing a resolution of ∼0.1 Hz for cantilever resonances ranging from 70 kHz to 300 kHz) at a rate far faster than with a thermal. These attributes are particularly beneficial for techniques such as dip-pen nanolithography.

Effect of Hydration Film on Scanning Images of Atomic Force Microscope

Effect of Hydration Film on Scanning Images of Atomoc Force Microscope

Determination of Hydration Film Thickness Using Atomic Force Microscopy

Hydration Force In The Atomic Force Microscope: A Computational Study

Towards High Accuracy Surface Profile Characterization in Atomic Force Microscopy

Study of Hydration Layers Near a Hydrophilic Surface in Water Through AFM Imaging

Atomic Force Microscope Tip Cleaning by Using Gratings As Micro‐washboards

DETERMINATION OF THICKNESS OF HYDRATION LAYERS ON MICA IN AQUEOUS SOLUTIONS BY USING AFM

Study on the Powder Imaging Method of Atomic Force Microscopy

Edge Effects and Coupling Effects in Atomic Force Microscope Images

A Study on Spatial Resolution of the Microwave Atomic Force Microscope Imaging Affected by Scanning Speed

Application of Atomic Force Microscopy in Understanding Crystallization Process

Multi Scan Mode Atomic Force Microscope with Improved Properties and High Applicability

A Large-Sample Atomic Force Microscope Observing in Both Air and Liquid

Optimizing atomic resolution of force microscopy in ambient conditions

Effect of the Thickness of Cell Ultrathin Sections on the Topographical Contrast in Atomic Force Microscopy

On Detection and Estimation in Atomic Force Microscopy at Different Scan Speeds

High-resolution measurement of atomic force microscope cantilever resonance frequency

Simulations of Subnanometer Scale Image Contrast in Atomic Force Microscopy of Self-Assembled Monolayers in Water

Study on Effects of Scan Parameters on the Image Quality and Tip Wear in Afm Tapping Mode

On Micro Scanning Forces under the Coupling Deformation of Atomic Force Microscope Probe