Fast Calculation of Probabilistic Total Transfer Capability Considering Static Voltage Stability Constraints and the Probability of Device Contingencies

WANG Cheng-shan,WANG Xing-gang,ZHANG Pei
DOI: https://doi.org/10.3321/j.issn:0258-8013.2006.19.002
2006-01-01
Abstract:A layered TTC(Total Transfer Capability)calculation model is developed based on Monte Carlo simulation and the SVSR(Statistic Voltage Stability Region)method.Load,generator output and device contingencies uncertainties are considered in this model.The post-contingency SVSR partial boundary is described by a plane,whose tangent point is directly calculated from the pre-contingency point by Damped Newton Method.The advantages of this proposed method are illustrated by an application to a IEEE RTS-118 system.
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