Abstract:The analytical model of a cylindrical eddy current probe placed above semi-infinite arbitrary layered structures is deduced by introducing magnetic vector potential based on the magnetoquasistatic Maxwell equations. During the impedance calculation, a symbolic operation is used to solve the coefficients of the magnetic vector potential expressions and as a result the impedance calculation becomes more efficient and less time-consuming. The presented analytical impedance model is applied in thickness measurement of a single layer metal and a conductive coating on a metal substrate in eddy current testing. The probe impedance response regularity due to the variation of thickness of single layer and conductive coating is investigated. Simulation results based on the presented model are in good agreement with the experimental ones and thus the correctness and effectiveness of the developed model is verified. There is every reason to believe that the impedance model can be applied in thickness measurement and be employed to determine other material properties of conductive structures and even used for the optimal design of eddy-current measurement systems.

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