Determination of Thermal Diffusivity of a Manganite Thin Film

DL Niu,XJ Liu,QJ Huang,SY Zhang
DOI: https://doi.org/10.1088/0256-307x/22/10/056
2005-01-01
Chinese Physics Letters
Abstract:Thermal diffusivity has been investigated in a manganite thin film La0.6Sr0.4MnO3 by means of transient grating (TG) technique at room temperature. A new method, which is generalized to two-layered samples of the thin film deposited on a semi-infinite substrate, is established to fit the TG signals. The thermal diffusivity of the La0.6Sr0.4MnO3 thin film with a thickness of 200 nm on an MgO (100) substrate is determined to be 0.92 mm2/s, which is slightly smaller than that of the single crystal sample (1 mm2/s).
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