Optical Monitoring of Contamination on High-Voltage Device

Y Sun,WB Zhao,GJ Zhang
DOI: https://doi.org/10.1109/iseim.2005.193584
2005-01-01
Abstract:A novel optical sensor for contamination monitoring is proposed. Based on the detection of the light intensity changes due to the contamination in light path, its severe status can be measured. The measurement principle is theoretically described. A principle prototype is set up, and the related experimental results indicate the feasibility of the method.
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