Temperature Characteristics of 850nm Oxide Confined VCSELs

Yongming Zhang,Jingchang Zhong,Yingjie Zhao,Yongqin Hao,Lin Li,yuxia Wang,Wei Su
DOI: https://doi.org/10.3969/j.issn.1674-4926.2005.05.033
2005-01-01
Abstract:Temperature characteristics of 850 nm oxide confined VCSELs have been investigated in heat tight system. Normal operations of the devices are observed at as high as 80°C. The slope efficiency of the devices decreases from 0.3 to 0.2 mW/mA at 20°C-80°C. According to temperature dependence of threshold current, the characteristic temperature of 350 K is obtained. The fundamental mode of the devices shifts to longer wavelengths by 0.11 nm/mW. The thermal resistance of the devices, determined by experiment is 2.02°C/mW.
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