Abstract:Metal-film dielectric capacitors provide lump portions of energy on demand. While the capacities of various capacitor designs are comparable in magnitude, their stabilities make a difference. Dielectric breakdowns - micro-discharges - routinely occur in capacitors due to the inevitable presence of localized structure defects. The application of polymeric dielectric materials featuring flexible structures helps obtain more uniform insulating layers. At the modern technological level, it is impossible to completely avoid micro-discharges upon device exploitation. Every micro-discharge results in the formation of a soot channel, which is empirically known to exhibit semiconductor behavior. Because of its capability to conduct electricity, the emerged soot channels harm the subsequent capacitor performance and decrease the amount of stored energy. The accumulation of the soot throughout a dielectric capacitor ultimately results in irreversible overall failure. In the context of the dielectric breakdown, self-healing designates a range of chemical processes, which spontaneously rearrange the atoms in the soot channels to partially return their insulative function. We developed a universal method capable of rating new capacitor designs including electrode and polymer material and their proportions. We found the best-performing designs produce abundant volatile by-products after micro-discharge, whereas the soot samples exhibit lower electronic conductivities. We proved the capability of the theoretical method to rate the empirical performance of the known capacitors. The method relies on various electronic-structure simulations and potential landscape explorations. The reported advance opens an impressive avenue to computationally probe thousands of hypothetical capacitor designs.

Experimental Study on a New Structure Self-healing High Energy Density Pulse Capacitor

Development of Electropulsing Treatment Device Based on Capacitor Energy Storage and Discharge

Study on Metallized Film Capacitor and Its Voltage Maintaining Performance

Theoretical and experimental studies on the self‐healing properties of metallised capacitor films under multiple stresses

On the Failure Mechanism of Metallized Polypropylene Pulse Capacitors

The Capacitance Loss Mechanism of Metallized Film Capacitor under Pulsed Discharge Condition

Study on the Structure–Function Relationship Between Metallized Layer and Self-Healing Morphology in Metallized Film

The Simultaneous Improvement of Energy Storage Density and Self-Healing Property of Metallized Film

Polyimide Films Impregnated with Epoxy Resin Demonstrating Superior Self-Healing Properties for Thermally Stable Energy Storage Capacitors

Influence factors for the self-healing of metallized polypropylene capacitors

Self-Healing in Dielectric Capacitors: a Universal Method to Computationally Rate Newly Introduced Energy Storage Designs

Self-healing Behaviors of Metallized High-Temperature Dielectric Films for Capacitor Applications

Self-healing Solid Tantalum Electrolytic Capacitors with Low ESR, High-Frequency Performance, and Simple Fabrication

Study of the in situ test setup and analysis methods for self-healing properties of metallized film capacitors

Progress in the Increase of Life in Five Kinds of High Energy Storage Capacitors

Calculation of Metallized Capacitor's Inner Pressure Intensity and Its Influence on the Self-Healing Characteristics

Experimental Study on the Lifetime of the All-Film Pulse Capacitor in LTD Systems

Core–shell structured PVDF-based copolymer fiber design for high energy storage performance

Calculation and Measurement of Metalized Film Capacitor's Inner Pressure and Its Influence on Self-Healing Characteristics

Capacitance Evaluation of Metallized Polypropylene Film Capacitors Considering Cumulative Self-Healing Damage

Reassessing Self-healing in Metallized Film Capacitors: A Focus on Safety and Damage Analysis