Research and Development of Tunneling Effect Through Semiconductor Multi-barrier Structures

WANG Hongmei,LIU Pijun,ZHANG Yafei
DOI: https://doi.org/10.3969/j.issn.1000-3819.2005.04.006
2005-01-01
Abstract:Starting from investigating the physical properties of tunneling effect through semiconductor multi-barrier structures and optimizing the structures and performance of electronic devices, this paper discusses the research and development of tunneling effect through semiconductor multi-barrier structures. Analytical solutions and numerical examples of tunneling effect through one-dimension semiconductor heterostructures have been summarized. Research and development of tunneling effect through semiconductor double barrier structures have been stressed. It includes resonant quasi-levels of coupling between transverse and longitudinal wave through symmetrical double barrier structures and analytical calculation of the resonant quasi-level lifetime in double barrier structures.
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