Experimental Study of Single- and Double-Electron Detachment for Negative Carbon Ions Incident on Helium

YY Huang,SM Wu,XM Zhang,GW Li,FQ Lu,FJ Yang
DOI: https://doi.org/10.1088/0256-307x/21/7/021
2004-01-01
Abstract:Using the growth rate method, we obtain the single-electron detachment (SED) cross-sections for 5–30 keV C−+He, and double-electron detachment (DED) cross-sections for 5–15 keV C−−+He. The SED cross-sections first increase with the increasing incident ion energy, and then decrease with further increase of the energy. The DED cross-sections increase with the increasing incident energy in the 5–15 keV region.
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