Single and Double Electron Detachment Cross Sections for C− Incident on Helium

YY Huang,SM Wu,EB Yang,M Gao,XM Zhang,GW Li,FQ Lu
DOI: https://doi.org/10.1016/j.nimb.2004.11.003
2005-01-01
Abstract:With growth rate method, double electron detachment (DED) cross-sections for 4–15keV H−+He are reported in this paper and are in agreement with other available experiment results. And for the first time, Single Electron Detachment (SED) cross-sections for 5–30keV C−+He, Double Electron Detachment (DED) cross-sections for 5–15keV C−+He are obtained in this work. The SED cross-sections at first increase as the incident ions energy increases, and then decrease as the energy is further increased in 5–30keV. The DED cross-sections increase as the incident energy increases in the region 5–15keV.
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