A New Metrics For Hierarchical Clustering

Guangwen Yang,Shuming Shi,Dingxing Wang
IF: 1.019
2003-01-01
Chinese Journal of Electronics
Abstract:Hierarchical clustering is a popular method of performing unsupervised learning. Some metric must be used to determine the similarity between pairs of clusters in hierarchical clustering. Traditional similarity metrics either can deal with simple shapes (i.e. spherical shapes) only or are very sensitive to outliers (the chaining effect). The main contribution of this paper is to propose some potential-based similarity metrics (APES and AMAPES) between clusters in hierarchical clustering, inspired by the concepts of the electric potential and the gravitational potential in electromagnetics and astronomy. The main features of these metrics are: the first, they have strong anti jamming capability; the second, they are capable of finding clusters of different shapes such as spherical, spiral, chain, circle, sigmoid, U shape or other complex irregular shapes; the third, existing algorithms and research fruits for classical metrics can be adopted to deal with these new potential-based metrics with no or little modification. Experiments showed that the new metrics are more superior to traditional ones. Different potential functions are compared, and the sensitivity to parameters is also analyzed in this paper.
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