Pressure Behavior of Te Isoelectronic Centers in ZnS:Te

ZL Fang,FH Su,BS Ma,K Ding,HX Han,GH Li,IK Sou,WK Ge
DOI: https://doi.org/10.1063/1.1517171
IF: 4
2002-01-01
Applied Physics Letters
Abstract:ZnS:Te epilayers with Te concentration from 0.5% to 3.1% were studied by photoluminescence under hydrostatic pressure at 15 K. Two emission bands related to the isolated Te1 and Te2 pair isoelectronic centers were observed in the samples with Te concentrations of 0.5% and 0.65%. For the samples with Te concentrations of 1.4% and 3.1%, only the Te2-related peak was observed. The pressure coefficients of all the Te1-related bands were found to be unexpectedly much larger than that of the ZnS band gap. The pressure coefficients for all the Te2-related bands are, however, rather smaller than that of ZnS band gap as usually observed. Analysis based on a Koster–Slater model indicates that an increase of the valence bandwidth with pressure is the main reason for the faster pressure shift of the Te1 centers, and the huge difference in the pressure behavior of the Te1 and Te2 centers is due mainly to the difference in the pressure-induced enhancement of the impurity potential on the Te1 and Te2 centers.
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