Intersecting Approach of Fault Diagnosis for Sub-Network-Level

蔡金锭,马西奎
DOI: https://doi.org/10.3321/j.issn:0253-987X.2001.12.004
2001-01-01
Abstract:Based on the topological conditions for fault diagnosability at sub-networks, this paper presents a new fast approach for fault diagnosis at sub-network-level of analog circuits. The rules of intersecting tearing are studied for the case with number of faulty sub-networks being less than three in large circuits, and logical fault-locating method is presented. Compared with the unified decomposition approach, an advantage of the present approach is that it breaks through the limitation that all torn terminals must be accessible and raises re-applying efficiency of accessible. Another advantage is that it reduces the range and computing time of fault diagnosis of large circuits.
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