Identifying Molecular Orientation of Individual C 60 on a Si\(111\)-\(7×7\) Surface

Jianguo Hou,Jinlong Yang,Haiqian Wang,Qunxiang Li,Changgan Zeng,Hai Lin,Wang Bing,Dongmin Chen,Qingshi Zhu
DOI: https://doi.org/10.1103/physrevlett.83.3001
IF: 8.6
1999-01-01
Physical Review Letters
Abstract:Low temperature scanning tunneling microscopy (STM) has been used to identify the molecular orientation of individual C60 on Si(111)-(7 × 7) surfaces. The STM images of individual C60 reveal clear and rich intramolecular features that are site and bias dependent. Theoretical simulations, using the local density approximation method with cluster models, uniquely reproduce the observed STM images and hence allow the unambiguous identification of the binding configurations of the adsorbed fullerenes with respect to the Si substrate. © 1999 The American Physical Society.
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