Minimum excited threshold in electron trapping materials

Wenhui Fan,Yongchang Wang,Xun Hou,Li Du,Binzhou Yang,Wei Zhao,Lihong Niu
1999-01-01
Abstract:Under the stimulation of the 1.064 μm ultra-short infrared pulse laser produced by a pulsed CPM Nd:YAG laser, projecting a reference light and measuring light simultaneously, and using a visible streak camera, the infrared minimum excited threshold of the electron trapping materials CaS:Eu, Sm was studied. The results show that the infrared minimum excited threshold of CaS:Eu, Sm measured by a visible streak camera with minimum detectable energy density less than 8.3×10-10 J/mm2 (532 nm), is less than 4.8×10-9 J/mm2.
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