Impact of Hierarchical Dopant‐Induced Microstructure on Thermoelectric Properties of p‐Type Si‐Ge Alloys Revealed by Comprehensive Multi‐Scale Characterization
Kyuseon Jang,Won‐Seok Ko,Ji‐Hee Son,Jeong‐In Jang,Bongseo Kim,Miquel Vega‐Parades,Hanhwi Jang,Maryam Allahyari,Se‐Ho Kim,KenHee Ryou,Donghyeon Chae,Hail Park,Yeon Sik Jung,Min‐Wook Oh,Chanwon Jung,Christina Scheu,Pyuck‐Pa Choi
DOI: https://doi.org/10.1002/adfm.202403785
IF: 19
2024-04-27
Advanced Functional Materials
Abstract:Hierarchical boron (B)‐induced microstructures of BxSi80Ge20 alloys with broad length scales are fully identified with their all microstructure features. The B‐induced microstructures lead to unusual variations in carrier concentration, density‐of‐states effective mass, and lattice thermal conductivity by their changes in distribution, volume fraction, and strain field around B‐induced phases. Such intricate microstructure‐property relationships determine the optimal doping concentration. Dopant‐induced microstructure in thermoelectric materials significantly affects thermoelectric properties and offers a potential to break the interdependence between electron and phonon transport properties. However, identifying all‐scale dopant‐induced microstructures and correlating them with thermoelectric properties remain a huge challenge owing to a lack of detailed microstructural characterization encompassing all length scales. Here, the hierarchical boron (B)‐induced microstructures in B‐doped Si80Ge20 alloys with different B concentrations are investigated to determine their precise effects on thermoelectric properties. By adopting a multi‐scale characterization approach, including X‐ray diffraction, scanning and transmission electron microscopy, and atom probe tomography, five distinctive B‐induced phases within Si80Ge20 alloys are identified. These phases exhibit different sizes, compositions, and crystal structures. Furthermore, their configuration is comprehensively determined according to B doping concentrations to elucidate their consequential impact on the unusual changes in carrier concentration, density‐of‐states effective mass, and lattice thermal conductivity. The study provides insights into the intricate relationship between hierarchical dopant‐induced microstructures and thermoelectric properties and highlights the importance of investigating all‐scale microstructures in excessively‐doped systems for determining the precise structure‐property relationships.
materials science, multidisciplinary,chemistry, physical,physics, applied, condensed matter,nanoscience & nanotechnology