Experimental study of excitation efficiency distribution in low-voltage-driven thin film electroluminescent devices

Jiayu Zhang,Yonghong Ye,Peifu Gu,Xu Liu,Jingfa Tang
1997-01-01
Abstract:The mechanism of the probe-doped-layer measurement was analyzed. The characteristics of excitation efficiency and its distribution across the phosphor were measured in low-voltage-driven thin film electroluminescent devices fabricated in the lad of the Zhejiang Univ. The experimental results prove that the excitation efficiency across the phosphor of the device is not homogeneous, and its variation depends on the applied voltage. The analysis shows that the low-voltage-driven thin film electroluminescent mechanism is attributed to inhomogeneous distribution of electric field in the phosphor.
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