Measurement of complex permittivity of multilayered dielectric samples by means of an electromagnetic open resonator

Jun Xia,Changhong Liang
1996-01-01
Tien Tzu Hsueh Pao/Acta Electronica Sinica
Abstract:A new method for the measurement of complex permittivity of multilayered dielectric samples at millimeterwave and submillimeterwave bands by means of an electromagnetic open resonator is proposed. At Ka band an electromagnetic open resonator dielectric measurement system is designed and constructed using a specially machined open resonator set, and measurements on some multilayered dielectric samples are made, the results are in good agreement with the criterion values.
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