Novel phase measuring profilometry

Hong Zhao,Wenyi Chen,Yushan Tan
1995-01-01
Abstract:A new method was presented to acquire 3D profile of an object by measuring the object twice. This technique can produce a correct unwrapping in the presence of discontinuities in the process of phase restoring. It has been introduced into the measurement of a 3D object shape, and satisfactory experimental results have been obtained. The geometry of projecting and imaging a grating pattern on the object was illustrated and the system characteristics were analyzed. Spatial resolution of this system is 0.01 mm. Experimental results indicated that this method is simple and practical, and higher measurement accuracy can be obtained.
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