Refractive index and absorption of copper phthalocyanine thin film

Qiying Chen,Donghong Gu,Fuxi Gan,
1996-01-01
Abstract:A cobalt phthalocyanine (CoPc) thin film was obtained by vacuum deposition on a single crystal silicon. The ellipsometric spectra of CoPc thin film had been investigated on a scanning ellipsometer with the analyser and polarizer rotate synchronously. The spectrum was explained with its energy levels. The complex dielectric function, the complex refractive index and the optical constant of the CoPc thin film were obtained in the wavelength range from 550 nm to 800 nm. The results show that the Q-band of CoPc film possesses larger absorption.
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