Atomic-Force Microscopic Study Of Rubbed Polyimide Films

YangMing Zhu,Lin Wang,Zuhong Lu,Yu Wei,X. X. Chen,Jau Tang
DOI: https://doi.org/10.1063/1.113069
IF: 4
1994-01-01
Applied Physics Letters
Abstract:Rubbed polyimide films have been studied by atomic force microscopy from micrometer to nanometer scales. On a large scale, oriented scratches and microstructures due to rubbing have been observed, while on a nanometer scale, oriented polyimide aggregates are visible. The alignment of liquid crystals on these films is thus discussed.
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