Rapid ULSI Interconnect Reliability Analysis Using Neural Networks

Yizhen Tian,Feifei He,Qi-Jun Zhang,Cher Ming Tan,Jianguo Ma
DOI: https://doi.org/10.1109/TDMR.2013.2247604
IF: 1.886
2014-01-01
IEEE Transactions on Device and Materials Reliability
Abstract:Neural network modeling method is introduced for analyzing ultralarge scale integration (ULSI) interconnect reliability for the first time. By training the simulation data from ANSYS (a finite-element tool), a neural network model is developed, where the prediction of ULSI interconnect reliability can be more effectively done. The proposed technique is useful for integrated circuit design since it...
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