Microwave Effective and Bulk Surface Impedance of Thin FeSe0.3Te0.7 Film

A. A. Barannik,Y. Wu,Y. -S. He,S. Luo,L. Cao,M. S. Kharchenko,N. T. Cherpak
DOI: https://doi.org/10.1109/msmw.2013.6622176
2013-01-01
Abstract:This present work is aimed at obtaining bulk (i.e. intrinsic) microwave properties Rs(T) and Xs(T) of FeSe1-xTex using our experimental data and thus to obtain temperature dependences of the penetration depth λL(T) and whole complex conductivity σ1(T)-i σ2(T). The results obtained for our thin epitaxial film and single crystal of the same compound are compared.
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