Research of adhesion force between dust particles and insulator surface using atomic force microscope

Jing Wang,Yan Li,Xidong Liang,Yingyan Liu
DOI: https://doi.org/10.3969/j.issn.1003-6520.2013.06.010
2013-01-01
Abstract:Adhesion forces of dust particles on different insulator surfaces are different. This is one of the important reasons causing the difference among contamination characteristics of different insulators. In order to study the adhesion force of different insulators acting on dust particles, we adopted atomic force microscope to measure the adhesion force of a single particle on different insulating materials, including ordinary glass, silicone rubber, porcelain, and tempered glass. The experimental results indicate that the adhesion force is affected by the material property, roughness, and surface charge of the samples and it is the strongest on the silicone rubber sample among the samples. The insulators in operation might accumulate surface charge, so the influence of the surface charge on the adhesion force was also researched. It is concluded that the charging of sample surface will produce long-range attraction on the dust particles, but has little influence on the adhesion force.
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