Symbolic fault modeling for switched-capacitor circuits

Jiandong Cheng,Guoyong Shi,Andy Tai,Frank Lee
DOI: https://doi.org/10.1109/TENCON.2013.6719067
2013-01-01
Abstract:A symbolic construction method allowing for parameter limit operation is proposed. Switched-capacitor circuits can be analyzed with this method by creating a symbolic z-domain transfer function represented in the form of a Binary Decision Diagram (BOD). Manipulating the symbols in BOD can simulate a variety of circuit faults, such as switch faults, capacitor faults, and opamp gain faults. Implementation methods are presented and illustration examples are provided.
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