A digital backstage calibration using comparator dithering

熊召新,蔡敏,贺小勇
DOI: https://doi.org/10.13245/j.hust.2013.08.009
2013-01-01
Abstract:A digital backstage calibration technique for a 14 bit 100 MS/s pipelined ADC (analog-to-digital converter) was proposed, which changed the threshold levels of sub analog-to-digital converters (ADCs) according to a pseudo-random noise (PN) pulse sequence. A large magnitude wideband dithers were injected into the ADC and measures the nonlinearity errors resulting from finite gain and capacitor mismatch in multiplying digital-to-analog converter (MDAC) were measured, which were fed back to the digital outputs of pipelined ADC for correction. This calibration method can efficiently suppress the impact caused by the capacitor mismatch and finite opamp gain errors without adding extra number of sampling capacitors and comparators, and is easy to realize without complex mathematic operation. Simulation results show that using the proposed calibration technique, the signal-to-noise-and-distortion ratio is increased from 63.3 dB to 78.7 dB and the spurious-free dynamic range (SFDR) improves from 65.5 dB to 93.3 dB.
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