X-ray photoemission spectroscopy studies of indium-tin-oxide films treated by oxygen plasma immersion ion implantation

Long He,Xiaoxuan Fan,Qiongrong Ou,Rongqing Liang
DOI: https://doi.org/10.1364/soled.2012.lm4a.5
2012-01-01
Abstract:Oxygen plasma immersion ion implantation (PIII) was introduced to modify indium-tin-oxide (ITO) films. X-ray photoemission spectroscopy (XPS) was employed to characterize the elements ratio and core level spectra of O1s at the surface of ITO. © 2012 OSA.
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