Structural, Dielectric, Ferroelectric and Piezoresponse Force Microscopy Characterizations of Bilayered Bi0.9Dy0.1FeO3/K0.5Na0.5NbO3 Lead-Free Multiferroic Films

Ling Chen,Wei Ren,Zuo-Guang Ye,Aifen Tian,Xiaoqing Wu,Peng Shi
DOI: https://doi.org/10.1063/1.4746086
IF: 2.877
2012-01-01
Journal of Applied Physics
Abstract:The structure, dielectric and ferroelectric properties of the bilayered Bi0.9Dy0.1FeO3/K0.5Na0.5NbO3 (BDF/KNN) lead-free thin films deposited on the Pt/TiO2/SiO2/Si substrates by pulsed laser deposition with different thickness ratios have been characterized. It is found that the introduction of the bottom KNN layer can effectively reduce the leakage current of the composite film, allowing the high polarization of the BDF layer to be displayed. The bilayered film with KNN to BDF thickness ratio of 1.2 exhibits the best dielectric and ferroelectric properties, with a remanent polarization 2Pr = 16.3 μC/cm2. The polar domain structure of that film has been imaged by means of piezoresponse force microscopy (PFM) and the switching of the polarization has been realized under an applied electric field of ±12 V, confirming the ferroelectricity in the BDF/KNN composite film.
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