Atomic-Level Study of A Thickness-Dependent Phase Change in Gold Thin Films Heated by an Ultrafast Laser

Yong Gan,Jixiang Shi,Shan Jiang
DOI: https://doi.org/10.1364/ao.51.005946
IF: 1.9
2012-01-01
Applied Optics
Abstract:An ultrafast laser-induced phase change in gold thin films with different thicknesses has been simulated by the method of coupling the two-temperature model and the molecular dynamics, including transient optical properties. Numerical results show that the decrease of film thickness leads to faster melting in the early nonequilibrium time and a larger melting depth. Moreover, earlier occurrence and a higher rate of resolidification are observed for the thicker film. Further analysis reveals that the mechanism for the thickness-dependent phase change in the films is the fast electron thermal conduction in the nonequilibrium state.
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