Interface Strain Coupling and Its Impact on the Transport and Magnetic Properties of LaMnO3 Thin Films Grown on Ferroelectrically Active Substrates

R. K. Zheng,Y. Wang,H. -U. Habermeier,H. L. W. Chan,X. M. Li,H. S. Luo
DOI: https://doi.org/10.1016/j.jallcom.2011.12.099
IF: 6.2
2012-01-01
Journal of Alloys and Compounds
Abstract:Thin films of LaMnO3 have been epitaxially grown on < 001 > oriented ferroelectric 0.67Pb(Mg1/3Nb2/3)O-3-0.33PbTiO(3) (PMN-PT) single-crystal substrates. The poling of the PMN-PT crystal causes a decrease in the resistance and an increase in the magnetization and magnetoresistance of the LaMnO3 film. In situ Xray diffraction measurements revealed that these changes arise from the poling-induced strain in the PMN-PT substrate, which reduces the in-plane tensile strain and the Jahn-Teller (JT) distortion of MnO6 octahedra of the LaMnO3 film. Moreover, it was found that the transport properties of LaMnO3 films are much more sensitive to the poling-induced strain than that of CaMnO3 films for which there is no JT distortion, implying that the electron-lattice coupling is one of the most important ingredients in understanding the strain effect in LaMnO3 films. (C) 2011 Elsevier B. V. All rights reserved.
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