Refractive Index Sensors Based on Ag-metalized Nanolayer in Microstructured Optical Fibers

Wei,Xia Zhang,Xin Guo,Long Zheng,Jing Gao,Weipeng Shi,Qi Wang,Yongqing Huang,Xiaomin Ren
DOI: https://doi.org/10.1016/j.ijleo.2011.07.044
IF: 3.1
2011-01-01
Optik
Abstract:We propose refractive index sensors based on Ag-metalized nanolayer in microstructured optical fibers. The surface plasmon resonance modes and the sensing properties are theoretically analyzed using finite element method (FEM). In the calculation, Drude–Lorentz model is used to describe the Metal Dielectric constant. The calculation results show that the sensitivity of Ag-metalized SPR sensor can reach 1500nm/RIU corresponding to a resolution of 6.67×10−5RIU. Comparing with conventional detecting material-Au under the same structure, the sensitivity and 3dB bandwidth of our device are better.
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