A Complex Index of Refraction Measurement of Soot Particles Based on the Ellipsometry Method

XING Jian,SUN Weimin,SUN Xiaogang,Sun Jinghua
DOI: https://doi.org/10.3969/j.issn.1006-7043.201012028
2012-01-01
Abstract:A complex index of refraction of soot particles is an important parameter in the processing calculation of the scattering characteristics of particles.The traditional KBr sample wafer transmission method requires particle size to meet the Mie scattering condition,and the testing process is very complex.In this paper,a novel method for producing a complex index of refraction measurement of particles based on the ellipsometry method was proposed.First,the ellipsometry measurement for the complex index of refraction theory was deduced;then a particle film on a glass floor was prepared,and soot particles were collected on a practical boiler.An experiment setting was built,and the multi-spectrum complex index of refraction of the soot particles was measured.The experiment results show that the measurement data agrees well with the KBr sample wafer transmission method.The novel method provides a new testing method for measurement of the index of refraction of other grains.
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