Evidence for finite-temperature glass transition in two dimensions

Qing-Hu Chen,Akihiro Tanaka,Xiao Hu
DOI: https://doi.org/10.1016/S0921-4526(02)02285-8
2003-01-01
Abstract:Large-scale simulations have been performed in the current-driven two-dimensional XY gauge glass model with resistively shunted junction dynamics, by means of a very effecient algorithm proposed before. It is found that the linear resistivity at low temperatures tends to zero, which indicates a finite temperature glass transition. Dynamical scaling analysis demonstrates that a nearly perfect collapse of current voltage data can be achieved with the transition temperature T-c = 0.22 (in units of the Josephson coupling strength), dynamical critical exponent z = 2.0, and the static exponent v = 1.2, which agrees quite well with recent findings by an equilibrium Monte Carlo simulations and finite-size scaling analysis in RSJ simulations. (C) 2003 Elsevier Science B.V. All rights reserved.
What problem does this paper attempt to address?