Advances in XFUMF and XRD using monolithic capillary x-ray lens

Ding Xunliang,He Jejun,Wei Fuzhong,Xie Jindong,Wang Dachun,Li Yude,Chen Baozhen,Chen Jun,Yan Yiming

1999-01-01

Abstract:Advances in XRMF and XRD using monolithic capillary x-ray lens, including the characteristics of the lens, are presented in this paper.

What problem does this paper attempt to address?

Application Of Monolithic Capillary Half Focusing X-Ray Lens In Micro-Exafs Analytical Technology

Tianxi Sun,LIU Zhi-Guo,Shiqiang Wei,Bo He,WEI Zheng,YANG Jun,ZENG Yi,Xiaoyan Lin,CHU Xue-Lian,Xunliang Ding

2007-01-01

Abstract:A monolithic capillary half focusing X-ray lens (MCHFXRL) is used to focus the synchrotron radiation. The magnitudes of the focal spot size and gain of the synchrotron radiation microbeam focused by the MCHFXRL are in the orders of 10 mu m and 10(3), respectively. In the energy range from 5.5 to 11.5keV, the focal spot size varies from 88 to 29 mu m; the transmission efficiency varies from 26.1% to 20.5%; the translation of the vertical position of the focal spot is 3 mu m; the change of the output focal distance is 155 mu m. On the basis of the investigation of the performances of the MCHFXRL, the application of the synchrotron radiation microbeam in micro-extended-X-ray-absorption-fine-structure (micro-EXAFS) analysis is studied.
Application of a Monolithic Polycapillary X-ray Lens in EXAFS Experiments

SUN Tian-xi,DING Xun-liang,LIU Zhi-guo,HE Bo,WEI Shi-qiang,XIE Ya-ning,LIU Tao,Peter M Rentzepis

DOI: https://doi.org/10.3321/j.issn:1004-924x.2007.12.001

2007-01-01

Optics and Precision Engineering

Abstract:The performance of the Monolithic Polycapillary X-ray Lens(MPXRL)for application in the Extended X-ray Absorption Fine Structure(EXAFS)technique is reported,especially,the main characters of the MPXRL such as gain in flux density,stabilizing effect,and high energy filtering.Experimental results show that the spatial resolution of the EXAFS facility based on the MPXRL is about 25 μm,and the gain in flux density of the Monolithic Polycapillary Focusing X-ray Lens(MPFXRL)is about 3 000 when the MPFXRL is used to focus the laser plasma pulsed X-ray for ultrafast time-resolved EXAFS experiments.These indicate that the MPXRL is helpful in the improvement of the EXAFS facilities.
Focal modulation microscopy with annular apertures: a numerical study.

Wei Gong,Ke Si,Nanguang Chen,Colin J R Sheppard

DOI: https://doi.org/10.1002/jbio.200900110

IF: 3.3899

2010-01-01

Journal of Biophotonics

Abstract:Image formation of focal modulation microscopy with annular aperture (AFMM) is presented. The spatial resolution is discussed. Compared with confocal microscopy, AFMM can simultaneously enhance the axial and transverse resolution. By adjusting the width of the annular objective aperture, AFMM can be adjusted from best spatial resolution performance to highest signal level. The capability of background rejection is also investigated, showing AFMM has the potential to further increase the imaging penetration depth. Finally, an optimal configuration of AFMM is elaborated. [GRAPHICS] Radial spoke pattern at the focal plane for focal modulation microscopy with annular apertures (AFMM).
Planar Focusing Lens for Enhanced Far-Field Ultrasonic Imaging.

Mengru Zhang,Jian Chen,Mu Chen,Zheng Fan

DOI: https://doi.org/10.1121/10.0015055

2022-01-01

Abstract:This paper presents a far-field enhanced-resolution underwater ultrasonic imaging on the basis of a single-slit structured planar focusing lens. The iterative angular spectrum approach was employed to optimize the planar focusing lens from a designated focal pattern, characterized by focal length and full width at half maxima. Numerical simulations and experimental investigations were conducted on different target objects. Compared to the conventional method, both results showed that the performance of far-field ultrasonic imaging was comprehensively enhanced with the proposed planar focusing lens, in terms of resolving capability, working distance, operational bandwidth, and robustness. The single-slit structured planar focusing lens is cost effective and easy to fabricate, which would greatly benefit ultrasonic imaging and drive new applications of ultrasound in various scenarios.
Ultra-thin, Zoom Capable, Flexible Metalenses with High Focusing Efficiency and Large Numerical Aperture

Yilin Shi,Hao Dai,Renjie Tang,Zequn Chen,Yalan Si,Hui Ma,Maoliang Wei,Ye Luo,Xingyi Li,Qing Zhao,Yuting Ye,Jialing Jian,Chunlei Sun,Kangjian Bao,Yaoguang Ma,Hongtao Lin,Lan Li

DOI: https://doi.org/10.1515/nanoph-2023-0561

IF: 7.5

2024-01-01

Nanophotonics

Abstract:The ever-growing demand for miniaturized optical systems presents a significant challenge in revolutionizing their core element – the varifocal lens. Recent advancements in ultra-thin, tunable metasurface optics have introduced new approaches to achieving zoom imaging. However, current varifocal metalens have faced challenges such as low focusing efficiency, limited tunability, and complicated designs. Here, we employ the high-contrast transmit arrays (HCTA) structures to design and fabricate a polarization-independent, single-layer flexible metalens that operates at a wavelength of 940 nm. Using a uniform stretching system, we characterized its optical performance to achieve over 60 % focusing efficiency within a 0 %–25 % stretch range, while the focal length changes align with theoretical predictions. Furthermore, our research also successfully demonstrated the capacity of a metalens with a numerical aperture (NA) of 0.5 to efficiently adjust imaging magnification within a 2× range, achieving imaging results that approach the diffraction limit. This research offers promising prospects for the practical use of compact and miniaturized optoelectronic devices in fields like photography, mixed reality, microscopy, and biomedical imaging.
A compact CCD-monitored atomic force microscope with optical vision and improved performances.

Liu Mingyue,Zhang Haijun,Zhang Dongxian

DOI: https://doi.org/10.1002/jemt.22250

2013-01-01

Microscopy Research and Technique

Abstract:A novel CCD-monitored atomic force microscope (AFM) with optical vision and improved performances has been developed. Compact optical paths are specifically devised for both tip-sample microscopic monitoring and cantilever's deflection detecting with minimized volume and optimal light-amplifying ratio. The ingeniously designed AFM probe with such optical paths enables quick and safe tip-sample approaching, convenient and effective tip-sample positioning, and high quality image scanning. An image stitching method is also developed to build a wider-range AFM image under monitoring. Experiments show that this AFM system can offer real-time optical vision for tip-sample monitoring with wide visual field and/or high lateral optical resolution by simply switching the objective; meanwhile, it has the elegant performances of nanometer resolution, high stability, and high scan speed. Furthermore, it is capable of conducting wider-range image measurement while keeping nanometer resolution. Microsc. Res. Tech. 76:931-935, 2013. (c) 2013 Wiley Periodicals, Inc.
Breaking the Diffraction Barrier Using Fluorescence Emission Difference Microscopy

Cuifang Kuang,Shuai Li,Wei Liu,Xiang Hao,Zhaotai Gu,Yifan Wang,Jianhong Ge,Haifeng Li,Xu Liu

DOI: https://doi.org/10.1038/srep01441

IF: 4.6

2013-01-01

Scientific Reports

Abstract:We propose a novel physical mechanism for breaking the diffraction barrier in the far field. Termed fluorescence emission difference microscopy (FED), our approach is based on the intensity difference between two differently acquired images. When fluorescence saturation is applied, the resolving ability of FED can be further enhanced. A detailed theoretical analysis and a series of simulation tests are performed. The validity of FED in practical use is demonstrated by experiments on fluorescent nanoparticles and biological cells in which a spatial resolution of <λ/4 is achieved. Featuring the potential to realize a high imaging speed, this approach may be widely applied in nanoscale investigations.
Numerical design and characterization of a novel parallel beam combined lens based on X-ray capillary optics

Lu Hua,Tianyu Yuan,Yuchuan Zhong,Huiquan Li,Jinyue Hu,Tianxi Sun,Xuepeng Sun

DOI: https://doi.org/10.1364/oe.519555

IF: 3.8

2024-04-04

Optics Express

Abstract:Lu Hua, Tianyu Yuan, Yuchuan Zhong, Huiquan Li, Jinyue Hu, Tianxi Sun, Xuepeng Sun A novel parallel beam combined lens (PBCL) was designed based on a parabolic monocapillary x-ray lens (PMXRL). The proposed PBCL converted ... [Opt. Express 32, 14102-14115 (2024)]

optics
Performances of Synchrotron Radiation Microbeam Focused by Monolithic Half Focusing Polycapillary X-Ray Lens

Tianxi Sun,Zhiguo Liu,Bo He,Shiqiang Wei,Yaning Xie,Tao Liu,Tiandou Hu,Xunliang Ding

DOI: https://doi.org/10.1016/j.nima.2007.02.069

2007-01-01

Abstract:A monolithic half focusing polycapillary X-ray lens (MHFPXRL) composed of 289,000 capillaries is used to produce a synchrotron radiation microbeam. The energy dependence of the output focal distance, focal spot size, transmission efficiency, vertical beam position, and gain in flux density of this microbeam is studied in detail. There is a slight change in the output focal distance of the MHFPXRL when the X-ray energies change.
Improvements in Micro-CT Method for Characterizing X-ray Monocapillary Optics

Zhao Wang,Kai Pan,Shuang Zhang,Zhuxuan Duo,Zhiguo Liu,Tianxi Sun

DOI: https://doi.org/10.1016/j.optcom.2021.127474

2021-09-15

Abstract:Accurate characterization of the inner surface of X-ray monocapillary optics (XMCO) is of great significance in X-ray optics research. Compared with other characterization methods, the micro computed tomography (micro-CT) method has its unique advantages but also has some disadvantages, such as a long scanning time, long image reconstruction time, and inconvenient scanning process. In this paper, sparse sampling was proposed to shorten the scanning time, GPU acceleration technology was used to improve the speed of image reconstruction, and a simple geometric calibration algorithm was proposed to avoid the calibration phantom and simplify the scanning process. These methodologies will popularize the use of the micro-CT method in XMCO characterization.

Instrumentation and Detectors,Image and Video Processing
Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Leora E. Dresselhaus-Marais,Bernard Kozioziemski,Theodor S. Holstad,Trygve Magnus Ræder,Matthew Seaberg,Daewoong Nam,Sangsoo Kim,Sean Breckling,Seonghyuk Choi,Matthieu Chollet,Philip K. Cook,Eric Folsom,Eric Galtier,Arnulfo Gonzalez,Tais Gorhover,Serge Guillet,Kristoffer Haldrup,Marylesa Howard,Kento Katagiri,Seonghan Kim,Sunam Kim,Sungwon Kim,Hyunjung Kim,Erik Bergback Knudsen,Stephan Kuschel,Hae-Ja Lee,Chuanlong Lin,R. Stewart McWilliams,Bob Nagler,Martin Meedom Nielsen,Norimasa Ozaki,Dayeeta Pal,Ricardo Pablo Pedro,Alison M. Saunders,Frank Schoofs,Toshimori Sekine,Hugh Simons,Tim van Driel,Bihan Wang,Wenge Yang,Can Yildirim,Henning Friis Poulsen,Jon H. Eggert

DOI: https://doi.org/10.1038/s41598-023-35526-5

2023-09-06

Abstract:The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, Dark Field X-ray Microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $10^{12}$ photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

Materials Science
Quantitative analysis of intermediately and infinitely thick samples with thin sample approach without sample preparation using confocal X-ray fluorescence

Xue-Peng Sun,Zhi-Guo Liu,Tian-Xi Sun,Song Peng,Wei-Yuan Sun,Fang-Zuo Li,Bo-Wen Jiang,Yong-Zhong Ma,Xun-Liang Ding

DOI: https://doi.org/10.48550/arXiv.1505.07530

2015-05-28

Abstract:In order to validate that the confocal X-ray fluorescence had potential applications in analyzing the intermediately and infinitely thick samples with thin sample approach without sample preparations, as an example, the confocal X-ray fluorescence based on polycapillary X-ray optics was used to analyze multi elements solutions.

Optics
Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

Y Kayser,W Błachucki,J-Cl Dousse,J Hoszowska,M Neff,V Romano

DOI: https://doi.org/10.1063/1.4869340

Abstract:The high-resolution von Hamos bent crystal spectrometer of the University of Fribourg was upgraded with a focused X-ray beam source with the aim of performing micro-sized X-ray fluorescence (XRF) measurements in the laboratory. The focused X-ray beam source integrates a collimating optics mounted on a low-power micro-spot X-ray tube and a focusing polycapillary half-lens placed in front of the sample. The performances of the setup were probed in terms of spatial and energy resolution. In particular, the fluorescence intensity and energy resolution of the von Hamos spectrometer equipped with the novel micro-focused X-ray source and a standard high-power water-cooled X-ray tube were compared. The XRF analysis capability of the new setup was assessed by measuring the dopant distribution within the core of Er-doped SiO2 optical fibers.
Crystallographic Data Collection Using a Multilayer Monochromator on an Undulator Beamline at the Shanghai Synchrotron Radiation Facility

Chenyu Zhang,Qin Xu,Weiwei Wang,Miao Liang,Li Yu,Minjun Li,Zhimin Zhu,Liqing Huang,Qianhui Li,Feng Yu,Yuzhu Wang,Huan Zhou,Qisheng Wang

DOI: https://doi.org/10.3390/cryst14020199

IF: 2.7

2024-02-20

Crystals

Abstract:To resolve photons hungry for weak diffraction samples by the crystallographic method, a double-multilayer monochromator (DMM) was employed on an undulator beamline (BL17UM) at the Shanghai Synchrotron Radiation Facility (SSRF) to provide a focused sub-micron beam with high brightness for macromolecular crystallography experiments. High-quality crystallographic datasets from model protein crystal samples were collected and processed by an existing crystallographic program for structure solution and refinement. The data quality was compared with datasets from a normal silicon crystal monochromator to evaluate the bandwidth of the DMM effect on these crystallographic data. This experiment demonstrates that multilayer optics on an undulator beamline may play a valuable role in satisfying the demands of structure-related research, which requires novel methods.

materials science, multidisciplinary,crystallography
High-efficiency focusing and imaging by dielectric kinoform zone plate lenses with soft X-rays.

Xujie Tong,Yifang Chen,Zijian Xu,Yijie Li,Zhenjiang Xing,Chengyang Mu,Jun Zhao,Xiangjun Zhen,Chengwen Mao,Renzhong Tai

DOI: https://doi.org/10.1107/S1600577522012115

IF: 2.557

2023-01-01

Journal of Synchrotron Radiation

Abstract:With fast advances in enhancing the focusing/imaging resolution of Fresnel zone plate lenses toward sub-10 nm, low diffraction efficiency in connection with their rectangular zone shape still remains a big issue in both soft and hard X-ray microscopy. In hard X-ray optics, encouraging progress has recently been reported in our earlier attempts of high focusing efficiency by 3D kinoform shaped metallic zone plates, formed by greyscale electron beam lithography. This paper addresses our efforts towards high focusing/imaging efficiency by developing a novel dielectric kinoform zone plate lens for soft X-rays. The effects of the zone materials and zone shapes on the focusing/imaging quality were first theoretically investigated by a modified thin-grating-approximation method, revealing superior efficiencies of dielectric kinoform zone plates over rectangular ones in metals. Optical characterizations of replicated dielectric kinoform zone plates by greyscale electron beam lithography demonstrate a focusing efficiency of 15.5% with a resolution of 110 nm in the water window of X-rays. Apart from high efficiency, the novel kinoform zone plate lenses developed in this work exhibit significant advantages over conventional zone plates, i.e. simplified process, low cost and no need for a beamstop.
Fast X-ray micro-tomography for low-Z materials

lijuan xu,runsheng chen,gang du,hong xie,tengfei xiao

DOI: https://doi.org/10.1088/1748-0221/10/03/C03010

2015-01-01

Journal of Instrumentation

Abstract:X-ray phase-contrast micro-tomography (XPCMT) is an important method for the non-destructive acquisition of internal information from samples composed of low-Z elements. During the development of XPCMT, its spatial resolution has gradually been improved; however, insufficient attention has been directed towards the improvement of its time resolution. The low time resolution of XPCMT restricts its applications in fast dynamic processes, such as the fermentation process and alloy growth. In this paper, we demonstrate a fast XPCMT method developed by combining the compressed sensing (CS) theory with XPCMT. This method allows for the accurate reconstruction of images using undersampled XPCMT data, thus achieving higher time resolution and simultaneously reducing the dose delivered to the samples; the latter is especially beneficial in medical applications. The CS-XPCMT algorithm was validated using experimental data from two samples, Fructus Foeniculi and a live ant, collected at the X-ray imaging and biomedical application beamline of the Shanghai Synchrotron Radiation Facility. The results for Fructus Foeniculi demonstrate that the CS-XPCMT algorithm yields good reconstruction accuracy for incomplete and undersampled data. Furthermore, the results for the live ant demonstrate that the CS-XPCMT algorithm is capable of performing fast XPCMT and is a potential method for the realisation of dynamic XPCMT, given appropriately upgraded experimental devices.
Lensless X-Ray Nanoimaging: Revolutions and opportunities

Yu-chen Karen Chen-Wiegart,Chris Jacobsen,Doga Gursoy

DOI: https://doi.org/10.1109/msp.2021.3122574

IF: 15.204

2022-01-01

IEEE Signal Processing Magazine

Abstract:Lensless X-ray nanoimaging provides 3D views of a wide range of materials with a spatial resolution better than 10 nm. These advances are enabled in part by dramatic gains in coherent X-ray flux, but they also rely on advances in signal processing to obtain images from coherent diffraction data. We outline the scientific problems that can be addressed by X-ray nanoimaging, the various imaging approaches and their associated reconstruction methods, and highlight opportunities for future advances.

engineering, electrical & electronic
Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography

Xuejuan Wu,Ning Zhou,Yang Chen,Jiasong Sun,Linpeng Lu,Qian Chen,Chao Zuo

DOI: https://doi.org/10.1038/s41377-024-01568-1

2024-09-05

Abstract:Lens-free on-chip microscopy is a powerful and promising high-throughput computational microscopy technique due to its unique advantage of creating high-resolution images across the full field-of-view (FOV) of the imaging sensor. Nevertheless, most current lens-free microscopy methods have been designed for imaging only two-dimensional thin samples. Lens-free on-chip tomography (LFOCT) with a uniform resolution across the entire FOV and at a subpixel level remains a critical challenge. In this paper, we demonstrated a new LFOCT technique and associated imaging platform based on wavelength scanning Fourier ptychographic diffraction tomography (wsFPDT). Instead of using angularly-variable illuminations, in wsFPDT, the sample is illuminated by on-axis wavelength-variable illuminations, ranging from 430 to 1200 nm. The corresponding under-sampled diffraction patterns are recorded, and then an iterative ptychographic reconstruction procedure is applied to fill the spectrum of the three-dimensional (3D) scattering potential to recover the sample's 3D refractive index (RI) distribution. The wavelength-scanning scheme not only eliminates the need for mechanical motion during image acquisition and precise registration of the raw images but secures a quasi-uniform, pixel-super-resolved imaging resolution across the entire imaging FOV. With wsFPDT, we demonstrate the high-throughput, billion-voxel 3D tomographic imaging results with a half-pitch lateral resolution of 775 nm and an axial resolution of 5.43 μm across a large FOV of 29.85 mm2 and an imaging depth of >200 μm. The effectiveness of the proposed method was demonstrated by imaging various types of samples, including micro-polystyrene beads, diatoms, and mouse mononuclear macrophage cells. The unique capability to reveal quantitative morphological properties, such as area, volume, and sphericity index of single cell over large cell populations makes wsFPDT a powerful quantitative and label-free tool for high-throughput biological applications.
X-ray focusing with efficient high-NA multilayer Laue lenses

Saša Bajt,Mauro Prasciolu,Holger Fleckenstein,Martin Domaracký,Henry N Chapman,Andrew J Morgan,Oleksandr Yefanov,Marc Messerschmidt,Yang Du,Kevin T Murray,Valerio Mariani,Manuela Kuhn,Steven Aplin,Kanupriya Pande,Pablo Villanueva-Perez,Karolina Stachnik,Joe Pj Chen,Andrzej Andrejczuk,Alke Meents,Anja Burkhardt,David Pennicard,Xiaojing Huang,Hanfei Yan,Evgeny Nazaretski,Yong S Chu,Christian E Hamm

DOI: https://doi.org/10.1038/lsa.2017.162

2018-03-23

Abstract:Multilayer Laue lenses are volume diffraction elements for the efficient focusing of X-rays. With a new manufacturing technique that we introduced, it is possible to fabricate lenses of sufficiently high numerical aperture (NA) to achieve focal spot sizes below 10 nm. The alternating layers of the materials that form the lens must span a broad range of thicknesses on the nanometer scale to achieve the necessary range of X-ray deflection angles required to achieve a high NA. This poses a challenge to both the accuracy of the deposition process and the control of the materials properties, which often vary with layer thickness. We introduced a new pair of materials-tungsten carbide and silicon carbide-to prepare layered structures with smooth and sharp interfaces and with no material phase transitions that hampered the manufacture of previous lenses. Using a pair of multilayer Laue lenses (MLLs) fabricated from this system, we achieved a two-dimensional focus of 8.4 × 6.8 nm2 at a photon energy of 16.3 keV with high diffraction efficiency and demonstrated scanning-based imaging of samples with a resolution well below 10 nm. The high NA also allowed projection holographic imaging with strong phase contrast over a large range of magnifications. An error analysis indicates the possibility of achieving 1 nm focusing.
X-ray free-electron laser induced acoustic microscopy (XFELAM)

Seongwook Choi,Sinyoung Park,Jiwoong Kim,Hyunhee Kim,Seonghee Cho,Sunam Kim,Jaeku Park,Chulhong Kim

DOI: https://doi.org/10.1016/j.pacs.2024.100587

IF: 9.656

2024-01-17

Photoacoustics

Abstract:The X-ray free-electron laser (XFEL) has remarkably advanced X-ray imaging technology and enabled important scientific achievements. The XFEL's extremely high power, short pulse width, low emittance, and high coherence make possible such diverse imaging techniques as absorption/emission spectroscopy, diffraction imaging, and scattering imaging. Here, we demonstrate a novel XFEL-based imaging modality that uses the X-ray induced acoustic (XA) effect, which we call X-ray free-electron laser induced acoustic microscopy (XFELAM). Initially, we verified the XA effect by detecting XA signals from various materials, then we validated the experimental results with simulation outcomes. Next, in resolution experiments, we successfully imaged a patterned tungsten target with drilled various-sized circles at a spatial resolution of 7.8 ± 5.1 μm, which is the first micron-scale resolution achieved by XA imaging. Our results suggest that the novel XFELAM can expand the usability of XFEL in various areas of fundamental scientific research.

engineering, biomedical,radiology, nuclear medicine & medical imaging,instruments & instrumentation

Advances in XFUMF and XRD using monolithic capillary x-ray lens

Application Of Monolithic Capillary Half Focusing X-Ray Lens In Micro-Exafs Analytical Technology

Application of a Monolithic Polycapillary X-ray Lens in EXAFS Experiments

Focal modulation microscopy with annular apertures: a numerical study.

Planar Focusing Lens for Enhanced Far-Field Ultrasonic Imaging.

Ultra-thin, Zoom Capable, Flexible Metalenses with High Focusing Efficiency and Large Numerical Aperture

A compact CCD-monitored atomic force microscope with optical vision and improved performances.

Breaking the Diffraction Barrier Using Fluorescence Emission Difference Microscopy

Numerical design and characterization of a novel parallel beam combined lens based on X-ray capillary optics

Performances of Synchrotron Radiation Microbeam Focused by Monolithic Half Focusing Polycapillary X-Ray Lens

Improvements in Micro-CT Method for Characterizing X-ray Monocapillary Optics

Simultaneous Bright- and Dark-Field X-ray Microscopy at X-ray Free Electron Lasers

Quantitative analysis of intermediately and infinitely thick samples with thin sample approach without sample preparation using confocal X-ray fluorescence

Laboratory-based micro-X-ray fluorescence setup using a von Hamos crystal spectrometer and a focused beam X-ray tube

Crystallographic Data Collection Using a Multilayer Monochromator on an Undulator Beamline at the Shanghai Synchrotron Radiation Facility

High-efficiency focusing and imaging by dielectric kinoform zone plate lenses with soft X-rays.

Fast X-ray micro-tomography for low-Z materials

Lensless X-Ray Nanoimaging: Revolutions and opportunities

Lens-free on-chip 3D microscopy based on wavelength-scanning Fourier ptychographic diffraction tomography

X-ray focusing with efficient high-NA multilayer Laue lenses

X-ray free-electron laser induced acoustic microscopy (XFELAM)