Transmission Electron Microscopy Study of Multilayer P–n Hetero-Junction La0.9Sr0.1MnO3/SrNb0.05Ti0.95O3 Thin Films

H. C. Yu,M. P. Wang,Y. L. Jia,C. Chen,W. C. Yang,C. D. Xia,L. F. Liu,Y. G. Wang
DOI: https://doi.org/10.1016/j.tsf.2010.10.050
IF: 2.1
2011-01-01
Thin Solid Films
Abstract:We have fabricated multilayer p–n hetero-junction structure La0.9Sr0.1MnO3/SrNb0.05Ti0.95O3 colossal magneto-resistivity thin films. The observations of transmission electron microscopy showed that the interfacial structure between La0.9Sr0.1MnO3 and SrNb0.05Ti0.95O3 was of great epitaxy and atomic level smooth. There was a superstructure within La0.9Sr0.1MnO3 thin films which was clarified in terms of the ordered partial substitution of La with Sr at center body of unit cell. Its chemical composition and distribution information investigated by electron energy loss spectrum and element mapping in the multilayer thin films were discussed.
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