Study on Non-linear Optical Properties of Nc-Si/sin_x MQW with Z-scan Method
SHEN Hai-bo,GUO Heng-qun,WANG Guo-li,WANG Jia-xian,WU Zhi-jun,SONG Jiang-ting,XU Jun,CHEN Kun-ji,WANG Qi-ming
DOI: https://doi.org/10.16818/j.issn1001-5868.2009.06.022
2009-01-01
Abstract:The nc-Si/SiNx multi-quantum well(MQW)was prepared by RF magnetron sputtering technique and thermal annealing.The sample was tested by low-angle XRD,Raman spectrometry and absorption spectrometry,and its structure and optical properties were studyed.Nonlinear optical properties of nc-Si/SiNx MQW were probed by a Z-Scan Technique.The experimental results show that the nonlinear refractive index of the sample is a negative value and the nonlinear absorption is two-photon absorption.After calculating,it is obtained that χ(3) of the sample is 7.50 10-8esu,the value of nc-Si/SiNx MQW is 4 orders of magnitude higher than that of bulk Silicon.The nonlinear mechanism of the material was discussed.The enhancement of nonlinear refractive index is mainly attributed to the enhancement of quantum confinement.