Determinations of third- and fifth-order nonlinearities by the use of the top-hat-beam Z scan: theory and experiment

Bing Gu,Xian-Chu Peng,Tao Jia,Jian-Ping Ding,Jing-Liang He,Hui-Tian Wang
DOI: https://doi.org/10.1364/JOSAB.22.000446
2005-01-01
Abstract:We made a theoretical investigation on the top-hat-beam Z scan when the nonlinear media possess third- and fifth-order nonlinearities simultaneously. A high-accuracy method was proposed to allow the determination of the nonlinear refraction coefficients related to the third- and fifth-order effects. We also reconfirmed the common procedure for dividing the contributions of the third- and fifth-order effects to the nonlinearity in the top-hat-beam Z-scan measurements; the results indicated that the common procedure can be still employed for the determination of the third-order nonlinearity, whereas it is inapplicable for the fifth-order nonlinearity. We investigated experimentally, as a test, the nonlinear refraction of a Disperse Yellow 7 thin film by using the top-hat-beam Z-scan technique, with 35-ps-duration pulses at a 1064-nm wavelength. (C) 2005 Optical Society of America.
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