Design of TIP-I Infrared Circuit Card Tester

YANG Xian-ming,YE Yu-tang,CHENG Zhi-qiang,FANG Liang
DOI: https://doi.org/10.3969/j.issn.1001-5078.2006.06.013
2006-01-01
Abstract:The TIP-I Circuit Card Tester(CCT) can be used in repair depots to detect and isolate circuit faults to the component level manually or automatically,using non-contact infrared imaging technique.Equipment description and its working principle are presented in this paper in details.Image join and image registration are used to widen its application.The use of TIPI CCT,which can improve the shortfalls of the conventional diagnostic test method,is time saving and inexpensive.
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