Abstract:Engineering quantum devices requires reliable characterization of the quantum system, including qubits, quantum operations (also known as instruments) and the quantum noise. Recently, quantum gate set tomography (GST) has emerged as a powerful technique for self-consistently describing quantum states, gates, and measurements. However, non-Markovian correlations between the quantum system and environment impact the reliability of GST. To address this, we propose a self-consistent operational framework called instrument set tomography (IST) for non-Markovian GST. Based on the stochastic quantum process, the instrument set describes instruments and system-environment (SE) correlations. We introduce a linear inversion IST (LIST) to describe instruments and SE correlations without physical constraints. The disharmony of linear relationships between instruments is detected. Furthermore, we propose a physically constrained statistical method based on the maximum likelihood estimation for IST (MLE-IST) {with adjustable dimensions}. MLE-IST shows significant flexibility in adapting to different types of devices, such as noisy intermediate-scale quantum (NISQ) devices, by adjusting the model and constraints. Experimental results demonstrate the effectiveness and necessity of simultaneously describing instruments and SE correlations. Specifically, the LIST and MLE-IST obtains significant improvement on average square error reduction in the imperfect implemented simulations by orders of -23.77 and -6.21, respectively, compared to their comparative methods. {Remarkably, real-chip experiments indicate that a polynomial number of parameters with respect to the Markovian order are sufficient to characterize non-Markovian quantum noise in current NISQ devices.} Consequently, IST provides an essential and self-consistent framework for characterizing, benchmarking, and developing quantum devices in terms of the instrument set.

The Implementation and Research of Circuit's Concurrent Properties in GSTE

Terminal Satisfiability in GSTE

Combinational Equivalence Checking Based on Circuit Topology Analysis

Research of GSTE-Based Verification on UART

An assertion graph based abstraction algorithm in GSTE and Its application

A Transformation-Based Approach to Implication of GSTE Assertion Graphs

Implication of Assertion Graphs in GSTE

General-Purpose Gate-Level Simulation with Partition-Agnostic Parallelism.

An Extension to Concurrent TTCN

Intelligent Modeling and Verification

Maximal models of assertion graph in GSTE

Efficient characterization of qudit logical gates with gate set tomography using an error-free Virtual-Z-gate model

Collaborative Verification Scheme for System Functional Properties

Introduction to Quantum Gate Set Tomography

A Test Generation Approach For Non-Synchronous Sequential Circuit

Conflict-driven Structural Learning Towards Higher Coverage Rate in ATPG

Enhancing ASIC Technology Mapping via Parallel Supergate Computing

Non-Markovian Quantum Gate Set Tomography

Parallel SER Analysis for Combinational and Sequential Standard Cell Circuits

Near-Minimal Gate Set Tomography Experiment Designs