Abstract:Engineering quantum devices requires reliable characterization of the quantum system, including qubits, quantum operations (also known as instruments) and the quantum noise. Recently, quantum gate set tomography (GST) has emerged as a powerful technique for self-consistently describing quantum states, gates, and measurements. However, non-Markovian correlations between the quantum system and environment impact the reliability of GST. To address this, we propose a self-consistent operational framework called instrument set tomography (IST) for non-Markovian GST. Based on the stochastic quantum process, the instrument set describes instruments and system-environment (SE) correlations. We introduce a linear inversion IST (LIST) to describe instruments and SE correlations without physical constraints. The disharmony of linear relationships between instruments is detected. Furthermore, we propose a physically constrained statistical method based on the maximum likelihood estimation for IST (MLE-IST) {with adjustable dimensions}. MLE-IST shows significant flexibility in adapting to different types of devices, such as noisy intermediate-scale quantum (NISQ) devices, by adjusting the model and constraints. Experimental results demonstrate the effectiveness and necessity of simultaneously describing instruments and SE correlations. Specifically, the LIST and MLE-IST obtains significant improvement on average square error reduction in the imperfect implemented simulations by orders of -23.77 and -6.21, respectively, compared to their comparative methods. {Remarkably, real-chip experiments indicate that a polynomial number of parameters with respect to the Markovian order are sufficient to characterize non-Markovian quantum noise in current NISQ devices.} Consequently, IST provides an essential and self-consistent framework for characterizing, benchmarking, and developing quantum devices in terms of the instrument set.

Introduction to Quantum Gate Set Tomography

Two-Qubit Gate Set Tomography with Fewer Circuits

Non-Markovian Quantum Gate Set Tomography

Randomized linear gate set tomography

Near-Minimal Gate Set Tomography Experiment Designs

Efficient characterization of qudit logical gates with gate set tomography using an error-free Virtual-Z-gate model

Microscopic parametrizations for gate set tomography under coloured noise

Characterizing non-Markovian Quantum Process by Fast Bayesian Tomography

Full Quantum Process Tomography of a Universal Entangling Gate on an IBM's Quantum Computer

Quantum Tomography: From Markovianity to Non-Markovianity

Quantum process tomography of continuous-variable gates using coherent states

Estimating gate-set properties from random sequences

Quantum Process Tomography of a Universal Entangling Gate Implemented with Josephson Phase Qubits

Recovering quantum gates from few average gate fidelities

Quantum process tomography of a Mølmer-Sørensen gate via a global beam

Transformer Models for Quantum Gate Set Tomography

Unitary quantum process tomography with unreliable pure input states

Practical, Reliable Error Bars in Quantum Tomography

Characterization and tomography of a hidden qubit

Robust Calibration of a Universal Single-Qubit Gate-Set via Robust Phase Estimation